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Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
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Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
Description
1st Edition
by Yang Leng (Author)
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Details
Year:
2008
Pages:
343
Language:
English
Format:
PDF
Size:
6 MB
ISBN-10:
470822988
ISBN-13:
978-0470822982
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