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Noise in Nanoscale Semiconductor Devices

Description

1st ed. 2020 Edition 

by Tibor Grasser (Editor) 

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects.

  • Describes the state-of-the-art, regarding noise in nanometer semiconductor devices;
  • Enables readers to design more reliable semiconductor devices;
  • Offers the most up-to-date information on point defects, based on physical microscopic models.

Details

Year:
2020
Pages:
724
Language:
English
Format:
PDF
Size:
48 MB
ISBN-10:
3030374998
ISBN-13:
978-3030374990
ASIN:
B087TMTGVS
Payment methods: PayPal, Debit or credit card (Visa/Mastercard, etc.), Digital Currency (Tether), WebMoney (Russian Ruble)
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