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X-Ray Structure Analysis

Description

by Theo Siegrist (Author) 

This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals. This is the ideal primer for students and graduates to understand the essentials of cristallography.

Details

Year:
2022
Pages:
250
Language:
English
Format:
PDF
Size:
61 MB
ISBN-10:
3110610701
ISBN-13:
9783110610703, 978-3-11-061070-3, 978-3110610703, 978-3-11-061083-3, 978-3110610833, 9783110610833, 978-3-11-061092-5, 978-3110610925, 9783110610925
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