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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications 1 Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications 1
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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Description

1st Edition 

by Greg Haugstad (Author) 

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

Details

Year:
2012
Pages:
481
Language:
English
Format:
PDF
Size:
8 MB
ISBN-10:
470638826
ISBN-13:
978-0470638828
ASIN:
B00971HPME
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